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New Characterization Techniques for Thin Polymer Films |
| Society of Plastics Engineers Monographs |
| Editor: Ho-Ming Tong (Thomas J. Watson Research Center, Yorktown Heights, New York); Editor: Luu T. Nguyen (Philips Research Laboratories, Signetics Corporation, Sunnyvale, California) |
| Various industries and universities have aimed their activities toward the development of highly sensitive techniques capable of studying ultrathin polymer films. Provides researchers with a working description of the principles of operation, areas of application and data analysis methods for some of the newly developed techniques, as well as sufficient references for future in-depth studies of thin polymer films. The techniques covered are divided into two groups--bulk property measurements and surface/interface property measurements--with chapters covering microdielectrometry, stress measurement by x-ray diffraction, laser interferometry, ion beam analysis, photothermal analysis, and XPS/SIMS/AES, among other techniques. Abstracts for each of the chapters are conveniently located in the preface.
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| Cloth Bound |
368 Pages, 7 x 10 in.
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Item #:
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0471623466
$190.00 |
John Wiley & Sons, Inc. | |
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