Accelerated Testing: Statistical Models, Test Plans, and Data Analysis |
| Wiley Series in Probability and Statistics |
| Wayne B. Nelson (Schenectady, NY ) |
| This practical resource presents modern, statistical methods for accelerated testing including test models, analyses of data, and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. This handy book features real test examples along with data analyses, computer programs, and references to the literature.
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| Paperback |
Pages, 6 x 9 in.
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Item #:
Price: |
0471697362
$105.00 |
John Wiley & Sons, Inc. | |
